Patent attributes
A test probe assembly includes a probe-supporting component and a test probe on it. According to one aspect of the invention, the probe-supporting component takes the form of a probe-supporting housing in which the test probe is partially disposed so that two test probe legs extend out of the housing to spaced-apart distal end portions of the legs, with the housing enhancing leg stability and limiting leg contact for less stray-impedance influence on test results when a user holds the housing and squeezes the distal end portions toward terminals on a device under test (DUT). According to another aspect, at least one of the distal end portions includes a terminal-contacting electrode having at least two electrically conductive elements for contacting a terminal on the DUT, each electrically conductive element being moveable to and from the terminal independent of the other element for multi-point contact (MPC) purposes resulting in reduced effective serial resistance (ESR) and enabling true Kelvin-type measurements. The legs are preferably composed of a plurality of thin, flat, laser-machined layers, and one alternate embodiment includes at least three terminal-contacting electrodes for use with a three-terminal DUT.
