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US Patent 7468507 Optical spot grid array scanning system
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Patent
Date Filed
January 25, 2006
Date of Patent
December 23, 2008
Patent Application Number
11339044
Patent Citations Received
US Patent 12119204 Particle beam system and the use thereof for flexibly setting the current intensity of individual particle beams
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US Patent 11657999 Particle beam system and method for the particle-optical examination of an object
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US Patent 11935721 System comprising a multi-beam particle microscope and method for operating the same
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US Patent 12094683 Method for operating a multi-beam particle beam microscope
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Patent Inventor Names
Alon Litman
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Emanuel Elyasef
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Nissim Elmaliach
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Ron Naftali
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Steven R. Rogers
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Doron Meshulach
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Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
7468507
Patent Primary Examiner
Georgia Y Epps
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