Patent attributes
Provided are a method, system, and device to monitor degradation of a signal due to circuit aging. In one embodiment, a signal may be applied to a data path prior to aging of the circuit producing the signal to provide a reference value. The signal generating circuit may then be aged while the data path is disabled to protect the data path from the effects of circuit aging. Upon reenabling the data path, the signal may be reapplied in an after stress test to measure the effects of circuit aging on the circuitry generating the signal. For example, the effects of circuit aging may be measured for clock duty cycle degradation, clock skew degradation and signal margin degradation as well as other signal parameters. Additional embodiments are described and claimed.
