US Patent 7472322 On-chip interface trap characterization and monitoring
Patent 7472322 was granted and assigned to Integrated Device Technology on December, 2008 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
May 31, 2005
0
Date of Patent
December 30, 2008
0
Patent Application Number
11141223
0
Patent Inventor Names
Zhijian Ma
0
Chunbo Liu
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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