US Patent 7474986 Defect analyzer
Patent 7474986 was granted and assigned to FEI Company on January, 2009 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 1, 2006
0
Date of Patent
January 6, 2009
0
Patent Application Number
11497565
0
Patent Inventor Names
James E. Hudson
0
Janet Teshima
0
Daniel E. Partin
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
Find more entities like US Patent 7474986 Defect analyzer
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
