Patent attributes
An access transistor arrangement is provided for a 6F2 stacked capacitor DRAM memory cell layout with shared bit line contacts. The access transistors are arranged in pairs along semiconductor lines. The two transistors of each pair of transistors are arranged laterally reversed opposing the respective common bit line section. Each pair of access transistors is separated from the adjacent pair of access transistors by an isolation transistor which is permanently turned off. The access transistors and the isolation transistors are formed as identical recessed channel transistors with elongated channel and enhanced isolation properties. The same dopant concentration may be provided for both junctions of the access transistors. As identical devices are provided both as access transistor and as isolation transistors, the complexity of lithographic patterning processes is reduced.