Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
January 13, 2009
Patent Application Number
10557679
Date Filed
May 18, 2004
Patent Primary Examiner
Patent abstract
A method suitable for testing an integrated circuit device is disclosed, the device comprising at least one module, wherein the at least one module incorporates at least one associated module monitor suitable for monitoring a device parameter such as temperature, supply noise, cross-talk etc. within the module.
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