Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
January 27, 2009
Patent Application Number
11977282
Date Filed
October 24, 2007
Patent Citations Received
Patent Primary Examiner
Patent abstract
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
