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US Patent 7495467 Temperature-independent, linear on-chip termination resistance

Patent 7495467 was granted and assigned to Lattice Semiconductor on February, 2009 by the United States Patent and Trademark Office.

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Patent attributes

Current Assignee
Lattice Semiconductor
Lattice Semiconductor
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
74954670
Patent Inventor Names
William B. Andrews0
John A. Schadt0
Mou C. Lin0
Date of Patent
February 24, 2009
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Patent Application Number
113008860
Date Filed
December 15, 2005
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Patent Primary Examiner
‌
Vibol Tan
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Patent abstract

In one embodiment of the invention, an integrated circuit, such as an FPGA, has one or more programmable termination schemes, each having a plurality of resistive termination legs connected in parallel, and a calibration circuit designed to control each termination scheme for process, voltage, and temperature (PVT) variations. The sense element in the calibration circuit and each resistive leg in each termination scheme has a transistor-based transmission gate connected in series with a non-silicided poly (NSP) resistor. The negative temperature coefficient of resistivity of each NSP resistor offsets the positive temperature coefficient of resistivity of the corresponding transmission gate to provide a temperature-independent sense element and temperature-independent termination legs. The temperature-independence and constant IV characteristic of the sense element and termination legs enable a single calibration circuit to simultaneously control multiple termination schemes operating at different termination voltage levels.

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