US Patent 7496874 Semiconductor yield estimation
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Patent abstract
A method, apparatus, and computer program product that performs yield estimates using critical area analysis on integrated circuits having redundant and non-redundant elements. The non-redundant elements are ignored or removed from the critical area analysis performed for undesired opens.
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US Patent 07496874 Semiconductor yield estimation US Patent 7496874 Semiconductor yield estimation
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Patent Number
0749687400
Patent Number
749687400
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Patent Jurisdiction
Patent Number
074968740
Date of Patent
February 24, 2009
0Patent Application Number
112752750
Date Filed
December 21, 2005
0Official Website
Patent Primary Examiner
Edits on 23 Sep, 2022
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
074968740
Date of Patent
February 24, 2009
0Patent Application Number
112752750
Date Filed
December 21, 2005
0Official Website
Patent Primary Examiner
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Golden AI
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US Patent 07496874 Semiconductor yield estimation
Infobox
Is a
Patent jurisdiction
Patent number
07496874
Date of patent
February 24, 2009
Patent application number
11275275
Date Filed
December 21, 2005
Patent primary examiner
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