Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
K. Reed Gleason0
John Martin0
Mike Andrews0
Tim Lesher0
Date of Patent
March 3, 2009
0Patent Application Number
119754760
Date Filed
October 19, 2007
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
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