US Patent 7501845 On-chip frequency degradation compensation
Patent 7501845 was granted and assigned to Intel on March, 2009 by the United States Patent and Trademark Office.
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Embodiments of the invention include a trio of reliability oscillators. In one embodiment, an on-chip frequency compensation circuit includes a selectively enabled reliability oscillator to generate a reference oscillating signal, a clocked reliability oscillator to generate an AC degraded oscillating signal, and a static reliability oscillator to generate a DC bias degraded oscillating signal. A compare circuit coupled to the reliability oscillators compares the oscillating signals and generates a frequency compensation signal if the comparison determines that there is frequency degradation greater than a predetermined threshold.
US Patent 07501845 On-chip frequency degradation compensation US Patent 7501845 On-chip frequency degradation compensation
US Patent 07501845 On-chip frequency degradation compensation
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