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US Patent 7507596 Method of fabricating a high quantum efficiency photodiode

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
February 23, 2006
Date of Patent
March 24, 2009
Patent Application Number
11360750
Patent Citations Received
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US Patent 12085789 Bias voltage generation in an optical measurement system
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US Patent 11877825 Device enumeration in an optical measurement system
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US Patent 11883181 Multimodal wearable measurement systems and methods
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US Patent 11903676 Photodetector calibration of an optical measurement system
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US Patent 11903713 Biofeedback for awareness and modulation of mental state using a non-invasive brain interface system and method
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US Patent 11950879 Estimation of source-detector separation in an optical measurement system
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US Patent 11969259 Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members
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US Patent 12059270 Systems and methods for noise removal in an optical measurement system
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US Patent 12059262 Maintaining consistent photodetector sensitivity in an optical measurement system
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US Patent 11771362 Integrated detector assemblies for a wearable module of an optical measurement system
•••
Patent Inventor Names
Jeng-Shyan Lin
0
Shou-Gwo Wuu
0
Chien-Hsien Tseng
0
Dun-Nian Yaung
0
Ho-Ching Chen
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7507596
Patent Primary Examiner
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Thanh Nguyen

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