Patent attributes
The present invention provides a plasma generating electrode inspection device capable of efficiently inspecting the parallelism, flatness, surface roughness, and dielectric strength of a plasma generating electrode. A plasma generating electrode inspection device 100 includes a reference quartz plate 2 provided with a film-shaped transparent conductor 1 disposed on one surface (outer surface 2a), a reference spacer 3 disposed on the outer edge of the other surface (inner surface 2b) of the reference quartz plate 2, a reference clamper 4 which can secure a plasma generating electrode 11 as an inspection target between the reference spacer 3 and the reference clamper 4, and a pulse power supply 5 capable of applying a pulse voltage between the transparent conductor 1 and the plasma generating electrode 11 as an inspection target while changing the voltage.
