US Patent 7518387 Shielded probe for testing a device under test

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Is a

Patent

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

75183870

Patent Inventor Names

Eric W. Strid0

Leonard Hayden0

Mike Andrews0

Tim Lesher0

Amr M. E. Safwat0

John Dunklee0

John Martin0

K. Reed Gleason0

Date of Patent

April 14, 2009

Patent Application Number

119060550

Date Filed

September 27, 2007

Patent Citations Received

‌

US Patent 11862901 Interposer

Patent Primary Examiner

‌

Vinh P Nguyen

Patent abstract

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

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