US Patent 7519882 Intelligent binning for electrically repairable semiconductor chips

Patent 7519882 was granted and assigned to Micron Technology on April, 2009 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee

Micron Technology

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

75198820

Patent Inventor Names

Brent M. Debenham0

Date of Patent

April 14, 2009

Patent Application Number

117657380

Date Filed

June 20, 2007

Patent Primary Examiner

‌

Phung M Chung

Patent abstract

The present invention relates to a system and method for testing one or more semiconductor devices (e.g., packaged chips). Test equipment performs at least tests of a first type on the semiconductor device and identifies failures in the semiconductor device, if any. A number of failures are determined. In the case where there are some failures, decision circuitry determines whether it is more efficient to repeat the tests or repair the semiconductor device, if it is repairable.

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