Patent attributes
A high-resolution scanning probe microscope using a coherent dual-tip probe comprises two single-atom protrusions on a single crystal metal wire. As the dual-tip probe scans across the surface of a sample material under an electrical bias, an interferenced electron wave function formed by two protruding atoms interacts with electron wave functions of the sample surface. Such an interferenced wave function has a distinctive pattern of electron wave density as high as four times that of a single-atom tip. A more distinctive microscopic image of the sample surface is therefore generated. The resolution of the dual-tip scanning probe microscopic image is also higher than that obtained by a single-tip probe because the interferenced electron wave function provides a confined and densely distributed interactive region.
