Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
May 5, 2009
Patent Application Number
11381274
Date Filed
May 2, 2006
Patent Primary Examiner
Patent abstract
Probe tips, methods for making probe tips, and method for using such probe trips are described. The probe tips can include a pedestal portion connected to a beam of a cantilever structure and a contact portion that can contact an electronic component that to be tested. The pedestal portion and contact portions can have a generally trapezoidal shape. The probe tips can also include a rectangular-shaped extension portion located between the base and contact portions. The probe tips can be made using a dual-etching process that creates the generally trapezoidal shape of the base and contact portions and the generally rectangular-shaped extension portion.
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