A mixed-voltage I/O buffer comprises an input circuit, an output circuit, an I/O pad, a pre-driver circuit coupled to the output circuit, two added coupled N-type transistors, and a dynamical gate-controlled circuit coupled to each gate of the two N-type transistors and the pre-driver circuit; one of the N-type transistors is coupled to the input circuit and the output circuit; the other N-type transistor and the dynamic gate-controlled circuit are together coupled to the I/O pad. Thereby, a mixed-voltage I/O buffer which receives 2×VDD-tolerant input signals and overcomes the hot-carrier degradation is realized.