Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Je-Young Park0
Ki-Sang Kang0
Date of Patent
May 12, 2009
Patent Application Number
11640893
Date Filed
December 19, 2006
Patent Primary Examiner
Patent abstract
A semiconductor memory test device and method thereof are provided. The example semiconductor memory test device may include a fail memory configured to store at least one test result of a memory under test, a mode selecting unit configured to output a selection signal for selecting a memory address protocol of the fail memory based upon which one of a plurality of test modes is active in the memory under test and an address arranging unit configured to arrange address signals to conform with the selected memory address protocol in response to the selection signal received from the mode selecting unit.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
