Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
June 2, 2009
0Patent Application Number
116981220
Date Filed
January 26, 2007
0Patent Primary Examiner
Patent abstract
An apparatus for testing integrated circuits is disclosed. The apparatus for testing integrated circuits comprises an integrated circuit and a tester. The integrated circuit undergoing testing receives an input signal, and outputs an output signal from a first output terminal or a second output terminal according to a first pulse width of the input signal, and outputs an error signal according to a difference between the first pulse width and a second pulse width. The tester outputs the input signal according to the output signal and the error signal.
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