A semiconductor memory device arranged for minimizing the duration of time required for conducting a batch verify action and thus speeding up a buffer write action is provided. The device which conducts a write action to memory cells in an address area, a batch verify action for collectively conducting verify action for a plurality of addresses, and repeats the batch verify action and the write action, comprises a detecting means for detecting whether or not each address contains an unwritten memory cell, and conducts a verify action at least at a part of the batch verify action excluding at least a part of addresses judged not to contain unwritten memory cells by the verify action at one or more cycles before.