Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kyohei Sakajiri0
Yuri Granik0
Date of Patent
June 23, 2009
0Patent Application Number
116210820
Date Filed
January 8, 2007
0Patent Primary Examiner
Patent abstract
A system for calculating mask data to create a desired layout pattern on a wafer reads all or a portion of a desired layout pattern. Mask data having pixels with transmission values is defined along with corresponding optimal mask data pixel transmission values. An objective function is defined that compares image intensities as would be generated on a wafer with an optimal image intensity at a point corresponding to a pixel. The objective function is minimized to determine the transmission values of the mask pixels that will reproduce the desired layout pattern on a wafer.
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