Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yasunao Takahashi0
Date of Patent
July 7, 2009
0Patent Application Number
111910130
Date Filed
July 28, 2005
0Patent Primary Examiner
Patent abstract
A semiconductor memory test apparatus has a log data generating unit for generating log data indicating a test result of a device under test based on output data from the device under test corresponding to a predetermined test pattern; and a log data storing unit for writing the generated log data sequentially and reading the stored log data sequentially. The log data storing unit, having a dual port structure, includes a memory portion, an input port and an output port.
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