Patent attributes
Provided is a scanning laser microscope including a first laser light source for emitting ultrashort pulsed laser light; a scanning unit for two-dimensionally scanning the ultrashort pulsed laser light on a specimen; a second laser light source for emitting continuous laser light; an irradiation-position adjusting unit for performing two-dimensional adjustment of an irradiation position of the continuous laser light on the specimen; an objective lens for focusing the ultrashort pulsed laser light and the continuous laser light onto the specimen and for collecting fluorescence generated in the specimen; a light-detecting unit for detecting the fluorescence, which is split off from a light path between the objective lens and the scanning unit; and a continuous-laser-light switching unit for permitting radiation of the continuous laser light when the light-detecting unit is not detecting required fluorescence from the specimen on the basis of the ultrashort pulsed laser light.
