US Patent 7567268 Image forming apparatus and abnormality detecting method
Patent 7567268 was granted and assigned to RICOH COMPANY,LTD. on July, 2009 by the United States Patent and Trademark Office.
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Patent Inventor Names
Hidenori Akamatsu0
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Patent abstract
A light-emission control unit controls an emission of a light beam from a light-beam generating unit based on an input image signal. A light-beam scanning unit deflects the light beam in a main scanning direction and irradiates the deflected light beam on an image carrier. An anomalous-light emission detecting unit detects an anomalous light emission of the light-beam generating unit when there is no image signal input to the light-emission control unit. A control unit performs an error processing based on the detected anomalous light emission.
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US Patent 07567268 Image forming apparatus and abnormality detecting method US Patent 7567268 Image forming apparatus and abnormality detecting method
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Patent Number
075672680
Patent Number
75672680
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0
Patent Jurisdiction
Patent Number
075672680
Date of Patent
July 28, 2009
0Patent Application Number
115046170
Date Filed
August 16, 2006
0Official Website
Patent Primary Examiner
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US Patent 07567268 Image forming apparatus and abnormality detecting method
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07567268
Date of patent
July 28, 2009
Patent application number
11504617
Date Filed
August 16, 2006
Patent primary examiner
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