US Patent 7571363 Parametric measurement of high-speed I/O systems
Patent 7571363 was granted and assigned to Agilent Technologies on August, 2009 by the United States Patent and Trademark Office.
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Patent Inventor Names
Adrian Wan-Chew Seet0
Hugh S. Wallace0
Klaus-Dieter Hilliges0
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Patent abstract
A phase comparator is used to test a device under test comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator; and determining parametric information pertaining to the I/O circuit of the device under test from the phase signal.
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US Patent 07571363 Parametric measurement of high-speed I/O systems US Patent 7571363 Parametric measurement of high-speed I/O systems
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Patent Number
07571363
Patent Number
7571363
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US Patent 07571363 Parametric measurement of high-speed I/O systems
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Is a
Current assignee
Patent jurisdiction
Patent number
07571363
Date of patent
August 4, 2009
Patent application number
11419003
Date Filed
May 18, 2006
Patent primary examiner
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