US Patent 7574682 Yield analysis and improvement using electrical sensitivity extraction
Patent 7574682 was granted and assigned to Freescale Semiconductor on August, 2009 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
February 28, 2007
0
Date of Patent
August 11, 2009
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Patent Application Number
11680012
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Patent Inventor Names
Lionel J. Riviere-Cazaux
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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