Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Luc Ouellet0
Date of Patent
August 25, 2009
0Patent Application Number
110549460
Date Filed
February 11, 2005
0Patent Primary Examiner
Patent abstract
A method of making an etched structure in the fabrication of a MEMS device involves depositing a bulk layer, typically of polysilicon, prone to surface roughness. At least one layer of photo-insensitive spin-on planarizing material, such as silicate-based spin-on glass, is formed on the bulk layer to reduce surface roughness. This is patterned with a photoresist layer. A deep etch is then performed through the photoresist layer into the bulk layer. This technique results in much more precise etch structures.
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