US Patent 7581143 Peripheral component interconnect bus test system and method therefor

A peripheral component interconnect (PCI) bus test system and method therefor, that is applied in a PCI test card. The PCI test card includes a static random-access-memory (SRAM). In the method, the data transaction of the PCI bus signal is disintegrated into a separate data operation, while eliminating the waveform interfering transaction. Through comparing the waveform of the data operation as separated from a PCI bus signal with the standard PCI bus waveform, the quality of the PCI bus signals can be precisely analyzed, thus realizing the hardware test of PCI bus.