Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
September 8, 2009
Patent Application Number
11344664
Date Filed
February 1, 2006
Patent Primary Examiner
Patent abstract
A parametric parameter is selected, which has an upper specification limit and a lower specification limit. A storage percentile is determined. The storage percentile is equal to a product yield percentage if the number of the set of measurements greater than the upper specification limit exceeds the number of the set of measurements lower than the lower specification limit, and is equal to the product yield percentage subtracted from one hundred percent if the number of the set of measurements less than the lower specification limit exceeds the number of the set of measurements greater than the upper specification limit. A measurement closest to the storage percentile is stored.
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