US Patent 7589551 On-wafer AC stress test circuit
Patent 7589551 was granted and assigned to United Microelectronics Corporation on September, 2009 by the United States Patent and Trademark Office.
Is a
Date Filed
April 23, 2008
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Date of Patent
September 15, 2009
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Patent Application Number
12107772
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Patent Inventor Names
Yun-Chi Yang
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Chao-Yung Lai
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Cheng-Li Lin
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Kuan-Cheng Su
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Chao-Yang Lin
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Patent Jurisdiction
Patent Number
Patent Primary Examiner
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