Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Toshiharu Sugiura0
Hideyuki Ohtake0
Date of Patent
September 22, 2009
0Patent Application Number
118693120
Date Filed
October 9, 2007
0Patent Primary Examiner
Patent abstract
A method of examining a configuration of a sample includes the step of irradiating a terahertz pulsed light, which possesses a wavelength to transmit through the sample, to at least two different portions of the sample, the step of detecting at least two electric field amplitude-time resolved waveforms of the terahertz pulsed light transmitted through the first and second portions of the object to be examined, and the step of examining the configuration of the sample based upon phase information obtained from the electric field amplitude-time resolved waveforms detected.
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