US Patent 7593158 Method and apparatus for the examination of specimens

A method in which specimens are examined using a microscope. For an illuminated specimen, spatially coherent light with at least one continuous wavelength range or a continuously tunable wavelength range is generated, and one or more wavelengths or wavelength ranges in the illumination light are selected in dependence on the prespecified method of examination. The specimen is then illuminated with the illumination light with the selected wavelengths or wavelength ranges, the illumination light and the emission light coming from the specimen are then subsequently separated, whereby the back radiated illumination light is suppressed in the detection beam before the detection and the emission light is detected. In such a method, the selection of the wavelengths or the wavelength ranges of the illumination light is tuned by means of the separation of the detection light and the illumination light and the suppression of the illumination light in such a manner that a prespecified control variable (R) is optimized.