Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
David H. Hoffman0
John Laurence Niven0
Eric Chen-Li Sheng0
Date of Patent
September 29, 2009
0Patent Application Number
118272900
Date Filed
July 10, 2007
0Patent Primary Examiner
Patent abstract
A plurality of devices under test are each subject to a body bias voltage during burn-in testing. The body bias voltage reduces leakage current associated with the devices under test. A test controller can access a store of information including leakage current as a function of body bias voltage and can select a body bias voltage that corresponds to the minimum leakage current in the store of information. A voltage supply coupled to the test controller can provide the body bias voltage corresponding to the minimum leakage current to the devices under test during the burn-in testing.
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