Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Nodari Sitchinava0
Samitha Samaranayake0
Rohit Kapur0
Thomas W. Williams0
Suryanarayana Duggirala0
Emil Gizdarski0
Frederic J. Neuveux0
Date of Patent
September 29, 2009
0Patent Application Number
121785170
Date Filed
July 23, 2008
0Patent Primary Examiner
Patent abstract
A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time.
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