Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Ohad Falik0
Date of Patent
October 6, 2009
0Patent Application Number
115898460
Date Filed
October 30, 2006
0Patent Primary Examiner
Patent abstract
Method and system for periodically measuring the junction temperature of a semiconductor device. The junction exited by at least two sequential predetermined currents of different magnitudes. The voltage response of the junction to the at least two currents is measured and the temperature of the junction is calculated, while substantially canceling ohmic effects, by using the voltage response and a correction factor obtained by periodically. Whenever desired, the junction is exited by a set of at least four sequential different currents having known ratios. The voltage response to the set is measured and the correction factor is calculated by using each voltage response to the set.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
