US Patent 7598763 Probe contacting electrode and electronic device
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Patent Inventor Names
Shoichi Nagamatsu0
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Patent abstract
A probe contacting electrode that is formed on a surface of a package of an electronic device and to which a probe of a probe device is contacted, including a lower layer part and an upper layer part made of a softer conductive material than a conductive material that forms the lower layer part.
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US Patent 07598763 Probe contacting electrode and electronic device US Patent 7598763 Probe contacting electrode and electronic device
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Patent Number
07598763
Patent Number
7598763
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Official Website
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US Patent 07598763 Probe contacting electrode and electronic device
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Is a
Patent jurisdiction
Patent number
07598763
Date of patent
October 6, 2009
Patent application number
11808519
Date Filed
June 11, 2007
Patent primary examiner
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