US Patent 7609388 Spatial wavefront analysis and 3D measurement
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Patent abstract
A method of wavefront (100) analysis including applying a transform to the wavefront, applying a plurality of different phase changes (110, 112, 114) to the transformed wavefront (108), obtaining a plurality of intensity maps (130, 132, 134) wherein the plurality of different phase changes are applied to region of the transformed wavefront, corresponding to a shape of the light source.
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US Patent 07609388 Spatial wavefront analysis and 3D measurement US Patent 7609388 Spatial wavefront analysis and 3D measurement
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Patent Number
0760938800
Patent Number
760938800
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Patent Jurisdiction
Patent Number
076093880
Date of Patent
October 27, 2009
0Patent Application Number
104997580
Date Filed
October 16, 2002
0Official Website
Patent Primary Examiner
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Infobox
Is a
Patent Jurisdiction
Patent Number
076093880
Date of Patent
October 27, 2009
0Patent Application Number
104997580
Date Filed
October 16, 2002
0Official Website
Patent Primary Examiner
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US Patent 07609388 Spatial wavefront analysis and 3D measurement
Infobox
Is a
Patent jurisdiction
Patent number
07609388
Date of patent
October 27, 2009
Patent application number
10499758
Date Filed
October 16, 2002
Patent primary examiner
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