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US Patent 7610527 Test output compaction with improved blocking of unknown values

Patent 7610527 was granted and assigned to Nec Laboratories America, Inc. on October, 2009 by the United States Patent and Trademark Office.

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Patent abstract

Implementations of the present principles are directed to test output compaction arrangements and a methods of generating control patterns for unknown blocking. The specified bits in the control patterns, which when using linear feedback shift register (LFSR) reseeding determines control data volume and LFSR size, are preferably organized in a manner so as to balance the number of specified bits in the control patterns across test patterns.

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