US Patent 7619433 Test circuit for a semiconductor integrated circuit
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Patent abstract
A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated in read operation; and a data output buffer for masking some of data input and output pins in response to the plurality of output buffer control signals.
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US Patent 07619433 Test circuit for a semiconductor integrated circuit US Patent 7619433 Test circuit for a semiconductor integrated circuit
Infobox
Patent Number
0761943300
Patent Number
761943300
Edits on 26 Mar, 2023
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
076194330
Date of Patent
November 17, 2009
0Patent Application Number
121812260
Date Filed
July 28, 2008
0Official Website
Patent Primary Examiner
Edits on 26 Sep, 2022
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
076194330
Date of Patent
November 17, 2009
0Patent Application Number
121812260
Date Filed
July 28, 2008
0Official Website
Patent Primary Examiner
Edits on 18 Jun, 2022
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US Patent 07619433 Test circuit for a semiconductor integrated circuit
Infobox
Is a
Patent jurisdiction
Patent number
07619433
Date of patent
November 17, 2009
Patent application number
12181226
Date Filed
July 28, 2008
Patent primary examiner
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