Patent attributes
Methods of enabling the use of defective programmable devices. The method comprises performing functional testing for each programmable device of a plurality of programmable devices; identifying each programmable device of the plurality of programmable devices having a defective portion of programmable blocks; identifying, for each programmable device which is identified to have a defective portion of programmable blocks, a location of the defective portion; and storing, for each programmable device which is identified to have a defective portion of programmable blocks, the location of the defective portion on the programmable device.