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US Patent 7622917 Methods and apparatus for inspecting materials

Patent 7622917 was granted and assigned to Scan Systems Corp. on November, 2009 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 12092610 Apparatus, systems, and methods for inspecting tubulars employing flexible inspection shoes
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edited on 19 Jan, 2024
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Patent Citations Received
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US Patent 11874253 Apparatus, systems, and methods for discriminate high-speed inspection of tubulars
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Patent Inventor Names
William T. Walters0
Xiaowen Wu0
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Patent abstract

Apparatus and methods for inspecting materials such as cylindrical and tubular members are disclosed. One apparatus includes a frame that supports a magnetic coil and a detector assembly, the detector assembly having one or more magnetic detectors adapted to be spaced a first distance from the material being inspected by one or more substantially frictionless members.

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US Patent 07622917 Methods and apparatus for inspecting materials US Patent 7622917 Methods and apparatus for inspecting materials

Infobox
Patent Number
076229170
Patent Number
76229170
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=076229170
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Infobox
Is a
Patent
Patent
0
Current Assignee
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Scan Systems Corp.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
076229170
Date of Patent
November 24, 2009
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Patent Application Number
121681450
Date Filed
July 6, 2008
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=076229170
Patent Primary Examiner
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Bot L LeDynh
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07622917
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 US Patent 07622917 Methods and apparatus for inspecting materials

Infobox
Is a
Patent
Patent
Current assignee
‌
Scan Systems Corp.
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07622917
Date of patent
November 24, 2009
Patent application number
12168145
Date Filed
July 6, 2008
Patent primary examiner
‌
Bot L LeDynh

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