Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Hi-Hyun Han0
Jee-Yul Kim0
Date of Patent
December 1, 2009
0Patent Application Number
119620260
Date Filed
December 20, 2007
0Patent Primary Examiner
Patent abstract
A multi-wordline test control circuit in a semiconductor integrated device for performing a multi-wordline test in a specified cell mat among a plurality of cell mats. The multi-wordline test control circuit comprises a multi-test control block for receiving a multi-wordline test signal and outputting a first test signal and a second test signal, and a multi-wordline test block for performing the multi-wordline test in a specified cell mat among a plurality of cell mats in response to the first test signal and the second test signal.
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