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Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
December 15, 2009
0Patent Application Number
110565370
Date Filed
February 10, 2005
0Patent Citations Received
Patent Primary Examiner
Patent abstract
An eye examination system is presented that obtains several parameters of the eye. A system according to some embodiments of the present invention include a keratometry system, a low coherence reflectometry system, and a low coherence interferometry system co-coupled to the eye. In some embodiments, the low coherence interferometry system can provide interferometric tomography data. A processor can be coupled to receive data from the keratometry system, the low coherence reflectometry system, and the low coherence interferometry system and calculate at least one parameter of the eye from that data.
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