Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Zhifeng Ren0
Jakub A. Rybczynski0
Krzysztof J. Kempa0
Michael J. Naughton0
Date of Patent
December 15, 2009
0Patent Application Number
115092710
Date Filed
August 24, 2006
0Patent Primary Examiner
Patent abstract
An apparatus and methods for nanolithography using nanoscale optics are disclosed herein. Submicron-scale structures may be obtained using standard photolithography systems with a de-magnifying lens. A de-magnifying lens for use in a standard photolithography system includes a film having a top surface, a bottom surface and a plurality of cylindrical channels containing a dielectric material; and an array of carbon nanotubes penetrating the film through the plurality of cylindrical channels, wherein an image on the top surface of the film is converted into a de-magnified image on the bottom surface of the film by the carbon nanotubes.
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