US Patent 7637656 Temperature measurement using changes in dielectric constant and associated resonance

A temperature measurement technique for calculating a temperature in a high temperature environment by monitoring a change in resonant frequency of a resonant structure loaded with a dielectric material. A response curve for a reflection coefficient S11 associated with the resonant structure is generated, typically by the use of a network analyzer connected to the resonant structure via a cable. A minimum point for the response curve is identified to detect the resonant frequency for the resonant structure. A calibration map is applied to the minimum point to identify a temperature associated with the resonant frequency of the resonant structure. The temperature associated with the resonant frequency of the resonant structure represents the temperature of the high temperature environment.