Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Swee Kian Cheng0
Cheng Siew Tay0
Eng Huat Goh0
Date of Patent
January 5, 2010
0Patent Application Number
116161640
Date Filed
December 26, 2006
0Patent Primary Examiner
Patent abstract
A method and apparatus is provided that pertains to resisting crack initiation and propagation in electrical interconnections between components and substrates in ball grid array microelectronic packages. A hybrid of dielectric defined and non-dielectric defined electrical interconnects reduces the potential for electrical interconnection failure without having to control the dielectric defined interconnect ratio of substrates. In addition selective orientation of the dielectric defined edge portion of the electrical interconnect away from the point where cracks initiate resists crack propagation and component failure.
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