Patent 7652467 was granted and assigned to Fujitsu on January, 2010 by the United States Patent and Trademark Office.
A carrier tray for use with a prober is arranged to allow the prober to measure or test not only semiconductor wafers but also semiconductor packages and accurately position each of different-shaped semiconductor packages. A carrier tray 1 includes a lowermost tray 10 and an uppermost tray 20 interposing therebetween an intermediate tray 30. The lowermost and uppermost trays 10 and 20 are each of a circular shape having a diameter D1. A diameter D3 of the intermediate tray 30 is smaller than the diameter D1. The intermediate tray 30 is centrally formed with a screw hole portion 32 in which a locking spacer screw 22 is screwed. A semiconductor package 40 is to be placed in a package holding pocket 11. With the locking spacer screw 22, the intermediate 30 is slidable in an X and Y directions, so that the X and Y coordinates of the semiconductor package 40 are determined uniquely relative to the carrier tray 1.