Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
February 2, 2010
Patent Application Number
11634813
Date Filed
December 6, 2006
Patent Primary Examiner
Patent abstract
An optical measurement device for determining at least two parameters of a measurement location of a surface of a workpiece positioned in a known coordinate system by a workpiece support is described. The device comprises a first light source providing a first measurement beam at a first wavelength and a second light source providing a second measurement beam at a second wavelength. The device also comprises a beam steering system positioning the first and second measurement beams to be collocated on the surface of the workpiece. Further, the device comprise a first imaging system, detecting the incoming position of the first measurement beam and an optical receiving system, detecting the incoming position of the second measurement beam.
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